ESD: Failure Mechanisms and Models
| Author | : | |
| Rating | : | 4.13 (516 Votes) |
| Asin | : | 0470511370 |
| Format Type | : | paperback |
| Number of Pages | : | 408 Pages |
| Publish Date | : | 2014-09-17 |
| Language | : | English |
DESCRIPTION:
The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology.Look inside for extensive coverage on:failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems;electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, s
It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. From the Back Cover Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. The book is uniq
Voldman was recently accepted as the first IEEE Fellow for ESD phenomena in semiconductors for ' contributions to electrostatic discharge protection CMOS, SOI and SiGe technologies'. EE (1981) and Electrical Engineer Degree (1982) from M.I.T; MS Engineering Physics (1986) and Ph.D EE (1991) from the University of Vermont under IBM's Resident Study Fellow Program. Dr. Since 1986, he has been responsible for defining the IBM ESD/latchup strate
Best book on this topic I'm an ESD engineer in the semiconductor industry. I have read many of the ESD books published in the past 20 years, but did not find one dedicated to this topic until this book was published. This is a very important topic for ESD and reliability engineering. So I'm sure that there are many engineers like me who have been waiting for such a book for a long time. This book is very well written like all the other books in this series by Dr. Voldman, who is an IEEE fellow and top expert in the world. The book starts from basic kn. Guowei Zhao said I have been looking for it!. I am a green hand in this field, though I am a ph.D student now. I changed my field to digital circuit design to my current circuit and device reliability. This book is quite goood for me, it contains very basic concept and also helps you to understand deeper. The author write very fluently and with clear logic. Even for me, English is not my first language, it is easy to read. It is really helpful, and I recommend it if you need systematic study. Shuyu.C